Plating Thickness Analysis with Skyray Spectrometers
Because of penetration depths, X-ray Fluorescence Spectroscopy is an ideal technique for coating thickness and plating measurement. XRF Spectrometer can do single or multiple coating thickness measurement for wide elemental range. Proper quality control of plated materials is important for manufacturers and component purchasers in order to avoid defective coatings and eliminate future problems. Skyray FPThick Plating Thickness Software allows measuring the individual thickness of multiple layers and to determine the elemental content in different layers. Skyray Instruments offers high performance Plating Thickness XRF Spectrometers for monitoring plating thickness and more economical XRF Analyzers to meet every clients application and budget.
- Measurements of functional coatings in the electronics and semiconductor industries
- Determining of the composition of electroplating baths
- Thin film measurements
- Single and multiple Layer Coatings
- Material analysis on printed circuit boards (PCB) and wafers
- Analysis of very thin coatings-gold/palladium coatings
- Complex multi-coating analysis
With an XRF Spectrometer, most of the cost is the upfront instrument purchase cost. There is no more need to send the samples to the lab and pay for each sample test. Unlike the lab, which may take a few weeks to get back your results, with an XRF Spectrometer the results are rapid and only take a minute for accurate plating thickness analysis. Skyray XRF Spectrometers don't require routine calibrations which greatly minimizes future service costs. Each one of our instruments is calibrated and set up for clients specific application in order to ensure our XRF Spectrometer will perform clients specific analysis needs. We have majority of standard samples in stock for specific calibrations and we can even use your specific samples for more effective calibrations. Also advanced users can create and add their own calibrations easily if the need for a new analysis arises in future.
Why use a Skyray XRF Spectrometer for plating thickness analysis?- rapid analysis – results in seconds
- non-destructive analysis
- ppm to 99.99 % concentration range
- minimal or no sample preparation
- analysis of any element Sodium(Na) to Uranium (U)
- solids, liquids, powders, films, granules etc.
- qualitative and quantitative analysis
Related Products
Thick8000 XRF Plating Thickness Analyzer
Plating Thickness XRF Analyzer for advanced detection of material coatings and platings
EDX 3600H Desktop XRF Spectrometer
High-Precision Plating Thickness Desktop XRF with Si-Pin Detector and SNE Technology
Our Technology
Skyray Instruments are manufactured to highest standards in order to deliver its customers the results they need in seconds read more
X-ray Fluorescence
X-ray Fluorescence (XRF) relies on the XRF detector, X-ray tube and detector electronics to find spectral peaks due to different energy x-rays. read more
Our Products
ABOUT US
Skyray Instruments specializes in the R&D, manufacturing and sales of analytical and measuring instruments in Spectroscopy, Chromatography and Mass Spectroscopy fields. Our Products include X-ray Fluorescence Spectrometry, Atomic Absorption Spectrometry, Gas Chromatography, Inductively Coupled Plasma Spectrometry, Mass Spectrometry and many others. With advanced research and development team Skyray has been providing customers around the world with reliable and affordable Scientific Instruments for more than 20 years
